O tulaga lelei o oloa fa'aeletonika ta'avale e sili atu ona mamafa nai lo mea fa'atau fa'atau. AEC-Q100 o se fa'ata'ita'iga na atia'e e le Automotive Electronics Council (AEC). AEC-Q100 na muamua lomia ia Iuni 1994. Ina ua maeʻa le silia ma le sefulu tausaga o atinaʻe, ua avea le AEC-Q100 ma tulaga lautele mo masini eletise eletise.
O le a le AEC-Q100?
O le AEC-Q100 e masani lava o se seti o faʻataʻitaʻiga faʻataʻitaʻiga ua fuafuaina mo oloa faʻapipiʻi tuʻufaʻatasia mo mea tau taʻavale. O lenei faʻamatalaga e taua tele mo le faʻaleleia atili o le faʻamaoni o oloa ma le faʻamautinoaga lelei. O le AEC-Q100 o le puipuia lea o tulaga eseese poʻo ni faʻalavelave faʻaletonu, ma faʻamaonia lelei le lelei ma le faʻamaoni o vaʻa taʻitasi, aemaise lava mo le suʻega masani o galuega ma faʻatinoga o oloa.
O a su'ega o lo'o aofia i le AEC-Q100?
Ole faʻamatalaga AEC-Q100 e 7 vaega ma le aofaʻi o suʻega 41.
- Vaega A-ACCELERATED ENVIRONMENT STRESS TESTS, o le aofaʻi o suʻega e 6, e aofia ai: PC, THB, HAST, AC, UHST, TH, TC, PTC, HTSL.
- Vaega B-ACCELERATED LIFETIME SIMULATION TESTS, o le aofaʻi o suʻega 3, e aofia ai: HTOL, ELFR, EDR.
- Vaega C-PACKAGE ASSEMBLY INTEGRITY TESTS, o le aofaʻi o suʻega e 6, e aofia ai: WBS, WBP, SD, PD, SBS, LI.
- Vaega D-DIE FABRICATION FABRICITY TESTS, o le aofaʻi o suʻega 5, e aofia ai: EM, TDDB, HCI, NBTI, SM.
- Vaega E-ELECTRICAL VERIFICATION TESTS, o le aofaʻi o suʻega 11, e aofia ai: TEST, FG, HBM/MM, CDM, LU, ED, CHAR, GL, EMC, SC, SER.
- Vaega F-DEFECT SCREENING SU'EGA, o le aofa'iga o su'ega e 11, e aofia ai: PAT, SBA.
- Vaega G-CAVITY PACKAGE SU'ESU'EGA FA'AMATALAGA, o le aofa'iga o su'ega e 8, e aofia ai: MS, VFV, CA, GFL, DROP, LT, DS, IWV.
Fautuaina le masini Bluetooth/Wi-Fi modules e fa'aogaina ai atigipusa agavaa AEC-Q100.
BLE Module: FSC-BT616V
Mo nisi faʻamatalaga, faʻamolemole asiasi www.feasycom.com
