Miyezo yamagetsi yamagalimoto yamagalimoto nthawi zonse imakhala yolimba kuposa zida zamagetsi zamagetsi. AEC-Q100 ndi muyezo wopangidwa ndi Automotive Electronics Council (AEC). AEC-Q100 idasindikizidwa koyamba mu June 1994. Pambuyo pazaka zopitilira khumi, AEC-Q100 yakhala muyezo wapadziko lonse lapansi wamakina amagetsi apagalimoto.
Kodi AEC-Q100 ndi chiyani?
AEC-Q100 makamaka ndi miyeso yoyeserera kupsinjika yopangidwira zinthu zophatikizika zamagalimoto zamagalimoto. Izi ndizofunikira kwambiri pakuwongolera kudalirika kwazinthu komanso kutsimikizika kwamtundu. AEC-Q100 ndikuletsa zochitika zosiyanasiyana kapena zolephera zomwe zingachitike, ndikutsimikizira mosamalitsa mtundu ndi kudalirika kwa chip chilichonse, makamaka pakuyesa kwanthawi zonse kwa ntchito ndi magwiridwe antchito.
Ndi mayeso ati omwe akuphatikizidwa mu AEC-Q100?
Mafotokozedwe a AEC-Q100 ali ndi magulu 7 ndi mayeso okwana 41.
- Gulu A-ACCELERATED ENVIRONMENT STRESS TESTS, mayeso 6 okwana, kuphatikiza: PC, THB, HAST, AC, UHST, TH, TC, PTC, HTSL.
- Gulu B-ACCELERATED LIFETIME SIMULATION TESTS, mayeso okwana 3, kuphatikiza: HTOL, ELFR, EDR.
- Gulu la C-PACKAGE ASSEMBLY INTEGRITY TESTS, mayeso okwana 6, kuphatikiza: WBS, WBP, SD, PD, SBS, LI.
- Gulu la D-DIE FABRICATION RELIABILITY TESTS, mayeso okwana 5, kuphatikiza: EM, TDDB, HCI, NBTI, SM.
- Gulu la E-ELECTRICAL VERIFICATION TESTS, mayeso okwana 11, kuphatikiza: TEST, FG, HBM/MM, CDM, LU, ED, CHAR, GL, EMC, SC, SER.
- Gulu la F-DEFECT SCREENING TESTS, mayeso okwana 11, kuphatikiza: PAT, SBA.
- Gulu la G-CAVITY PACKAGE INTEGRITY TESTS, mayeso 8 okwana, kuphatikiza: MS, VFV, CA, GFL, DROP, LT, DS, IWV.
Ma module a Bluetooth/Wi-Fi amalangizidwa agalimoto yamagalimoto omwe amatengera ma chipset oyenerera a AEC-Q100.
Chithunzi cha FSC-BT616V
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